Ellipsometry in the measurement of surfaces and thin films : symposium proceedings washington 1963, symposium held September 5-6, 1963, at the National Bureau of Standards, Washington, D.C.
書誌事項
- タイトル
- "Ellipsometry in the measurement of surfaces and thin films : symposium proceedings washington 1963, symposium held September 5-6, 1963, at the National Bureau of Standards, Washington, D.C."
- 責任表示
- edited by E. Passaglia, R.R. Stromberg and J. Kruger
- 出版者
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- [For sale by the Superintendent of Documents, U.S. Government Printing Office]
- 出版年月
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- 1964
- 書籍サイズ
- 24 cm
この図書・雑誌をさがす
注記
At head of title: United States Separtment of Commerce. National Bureau of Standards
Includes bibliographical references and index
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詳細情報 詳細情報について
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- CRID
- 1130000794477894656
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- NII書誌ID
- BA20408776
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- LCCN
- 64060043
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- Web Site
- https://lccn.loc.gov/64060043
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- 本文言語コード
- en
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- 出版国コード
- us
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- タイトル言語コード
- en
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- 出版地
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- [Washington, D.C.]
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- データソース種別
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- CiNii Books