CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test

CiNii Available at 5 libraries

Bibliographic Information

Title
"CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test"
Statement of Responsibility
Andrei Pavlov, Manoj Sachdev
Publisher
  • Springer
Publication Year
  • c2008
Book size
25 cm

Search this Book/Journal

Notes

Includes bibliographical references (p. 183-189) and index

Related Books

See more

Details 詳細情報について

Back to top