Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.
Bibliographic Information
- Title
- "Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A."
- Statement of Responsibility
- editors: C.V. Thompson, J.R. Lloyd
- Publisher
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- Materials Research Society
- Publication Year
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- c1992
- Book size
- 24 cm
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Notes
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130000794704890368
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- NII Book ID
- BA18823607
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- ISBN
- 1558991603
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- LCCN
- 92027362
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- Web Site
- https://lccn.loc.gov/92027362
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Pittsburgh, PA
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- Data Source
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- CiNii Books