Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies

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Title: "Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies"

Statement of Responsibility: edited by Harzara S. Rathore, Geraldine C. Schwartz, Robin A. Susko ; [sponsored by] Dielectrics and Insulation and Electronics divisions

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Reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies

Includes bibliographical references and indexes

"... held during the Fall meeting of the Electrochemical Society, October 9 to 14, 1988"--on pref

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