Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies

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書誌事項

タイトル
"Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies"
責任表示
edited by Harzara S. Rathore, Geraldine C. Schwartz, Robin A. Susko ; [sponsored by] Dielectrics and Insulation and Electronics divisions
出版者
  • Electrochemical Society
出版年月
  • c1989
書籍サイズ
23 cm
タイトル別名
  • Reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies

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注記

Includes bibliographical references and indexes

"... held during the Fall meeting of the Electrochemical Society, October 9 to 14, 1988"--on pref

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