Defects, recognition, imaging and physics in semiconductors, 1999 : proceedings of the eighth International Conference on Defects, Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15-18, 1999

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Bibliographic Information

Title
"Defects, recognition, imaging and physics in semiconductors, 1999 : proceedings of the eighth International Conference on Defects, Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15-18, 1999"
Statement of Responsibility
edited by T. Ogawa, M. Tajima
Publisher
  • North-Holland : Elsevier
Publication Year
  • c2000
Book size
27 cm

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Notes

"Special issue of Journal of crystal growth volume 210/1-3"--Back cover

Includes bibliographical references

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Details 詳細情報について

  • CRID
    1130000794825224064
  • NII Book ID
    BA54472222
  • Text Lang
    en
  • Country Code
    ne
  • Title Language Code
    en
  • Place of Publication
    • Amsterdam ; Tokyo
  • Data Source
    • CiNii Books
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