Atom-probe field ion microscopy and its applications

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Bibliographic Information

Title
"Atom-probe field ion microscopy and its applications"
Statement of Responsibility
Toshio Sakurai, A. Sakai, H.W. Pickering
Publisher
  • Academic Press
Publication Year
  • c1989
Book size
24 cm

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Notes

Bibliography: p. 275-292

Includes index

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Details 詳細情報について

  • CRID
    1130000794982182400
  • NII Book ID
    BA06995219
  • ISBN
    0120145820
  • LCCN
    63012814
  • Web Site
    https://lccn.loc.gov/63012814
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Boston
  • Classification
  • Data Source
    • CiNii Books
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