Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]

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Bibliographic Information

Title
"Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]"
Statement of Responsibility
edited by Brian K. Tanner and D. Keith Bowen
Publisher
  • Plenum Press
Publication Year
  • c1980
Book size
26 cm

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Notes

"Published in cooperation with NATO Scientific Affairs Division."

Includes bibliographical references and index

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