Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]
Bibliographic Information
- Title
- "Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom]"
- Statement of Responsibility
- edited by Brian K. Tanner and D. Keith Bowen
- Publisher
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- Plenum Press
- Publication Year
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- c1980
- Book size
- 26 cm
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Notes
"Published in cooperation with NATO Scientific Affairs Division."
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130000795054485376
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- NII Book ID
- BA03216360
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- ISBN
- 0306406284
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- LCCN
- 80026509
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- Web Site
- https://lccn.loc.gov/80026509
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- New York, N.Y.
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- Subject
-
- Data Source
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- CiNii Books