Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A.

Lin, Qinghuang, Materials Research Society. Spring Meeting, Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics

Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A.

CiNii 所蔵館 3館

Lin, Qinghuang
Materials Research Society. Spring Meeting
Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics

書誌事項

タイトル: "Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A."

責任表示: editors: Qinghuang Lin ... [et al.]

出版者

Materials Research Society

出版年月

c2007

書籍サイズ: 24 cm

この図書・雑誌をさがす

国立国会図書館サーチ
カーリル
WorldCat

注記

"Symposium B, "Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- and Nanoelectronics," the MRS "interconnect symposium", held April 10-12 at the 2007 MRS Spring Meeting in San Francisco, California ..."--Pref

Includes bibliographical references and indexes

Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A.

書誌事項

この図書・雑誌をさがす

注記

関連図書・雑誌

詳細情報詳細情報について

書き出し

Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A.

書誌事項

この図書・雑誌をさがす

注記

関連図書・雑誌

詳細情報 詳細情報について

書き出し

詳細情報詳細情報について