Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA

CiNii Available at 3 libraries

Bibliographic Information

Title
"Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA"
Statement of Responsibility
Philip T.C. Chen, O. Manuel Uy chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, The Boeing Company (USA) ... [et al.]
Publisher
  • SPIE
Publication Year
  • c2002
Book size
28 cm

Search this Book/Journal

Notes

Includes bibliographical references and index

Related Books

See more

Details 詳細情報について

  • CRID
    1130000795455753728
  • NII Book ID
    BA61356764
  • ISBN
    081944541X
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Bellingham, Wash., USA
  • Data Source
    • CiNii Books
Back to top