Notes on SEM examination of microelectronic devices

HathiTrust 1977 Web Site CiNii Available at 1 libraries

Bibliographic Information

Title
"Notes on SEM examination of microelectronic devices"
Statement of Responsibility
John R. Devaney, K.O. Leedy and W.J. Keery
Publisher
  • U.S. G.P.O.
Publication Year
  • 1977
Book size
26 cm
Volume(Year)
  • no.400:35

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Notes

Includes bibliographical references

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