Optical characterization techniques for semiconductor technology : April 1-2, 1981, San Jose, California
Bibliographic Information
- Title
- "Optical characterization techniques for semiconductor technology : April 1-2, 1981, San Jose, California"
- Statement of Responsibility
- D.E. Aspnes, S. So, R.F. Potter, editors
- Publisher
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- S.P.I.E.-- Society of Photo-optical Instrumentation Engineers
- Publication Year
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- 1981
- Book size
- 28 cm
- Series Name / No
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- pbk.
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Notes
Includes bibliographical references and indexes
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Details 詳細情報について
-
- CRID
- 1130000796125497216
-
- NII Book ID
- BA23923983
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- ISBN
- 0892523093
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- LCCN
- 81051404
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- Web Site
- https://lccn.loc.gov/81051404
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Wash.
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- Classification
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- LCC: TK7871.85
- DC19: 621.3815/2/0287
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- Data Source
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- CiNii Books