Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970
書誌事項
- タイトル
- "Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970"
- 出版者
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- American Society for Testing and Materials
- 出版年月
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- c1971
- 書籍サイズ
- 23 cm
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注記
Sponsored by ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E-24 on Fracture Testing of Metals
Includes bibliographical references
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詳細情報 詳細情報について
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- CRID
- 1130000796251287424
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- NII書誌ID
- BA02962433
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- LCCN
- 70155959
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- Web Site
- https://lccn.loc.gov/70155959
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- 本文言語コード
- en
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- 出版国コード
- us
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- タイトル言語コード
- en
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- 出版地
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- Philadelphia
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- 分類
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- LCC: TA460
- DC: 620.1/6/6028
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- 件名
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- データソース種別
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- CiNii Books