Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970
Bibliographic Information
- Title
- "Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970"
- Publisher
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- American Society for Testing and Materials
- Publication Year
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- c1971
- Book size
- 23 cm
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Notes
Sponsored by ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E-24 on Fracture Testing of Metals
Includes bibliographical references
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Details 詳細情報について
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- CRID
- 1130000796251287424
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- NII Book ID
- BA02962433
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- LCCN
- 70155959
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- Web Site
- https://lccn.loc.gov/70155959
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Philadelphia
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- Classification
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- LCC: TA460
- DC: 620.1/6/6028
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- Subject
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- Data Source
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- CiNii Books