Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970

Web Site CiNii 所蔵館 25館

書誌事項

タイトル
"Applications of electron microfractography to materials research : a symposium presented at the seventy-third annual meeting, American Society for Testing and Materials, Toronto, Ont., Canada, 21-26 June 1970"
出版者
  • American Society for Testing and Materials
出版年月
  • c1971
書籍サイズ
23 cm

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注記

Sponsored by ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E-24 on Fracture Testing of Metals

Includes bibliographical references

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