Surface characterization and testing II : 10-11 August 1989, San Diego, California
Bibliographic Information
- Title
- "Surface characterization and testing II : 10-11 August 1989, San Diego, California"
- Statement of Responsibility
- John E. Greivenkamp, Matt Young, chairs/editors
- Publisher
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- SPIE--the International Society for Optical Engineering
- Publication Year
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- c1989
- Book size
- 28 cm
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Notes
"Sponsored by SPIE--the International Society for Optical Engineering."
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130000796561449728
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- NII Book ID
- BA24342953
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- ISBN
- 0819402001
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- LCCN
- 89043274
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- Web Site
- https://lccn.loc.gov/89043274
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Wash., USA
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- Data Source
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- CiNii Books
