Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications
CiNii
Available at 8 libraries
Bibliographic Information
- Title
- "Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications"
- Statement of Responsibility
- S. Rein
- Publisher
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- Springer
- Publication Year
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- 2005
- Book size
- 25 cm
- Series Name / No
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- : hd. bd
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Notes
Includes bibliographical references and index
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Details 詳細情報について
-
- CRID
- 1130000796565937664
-
- NII Book ID
- BA7254577X
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- ISBN
- 3540253033
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- Text Lang
- en
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- Country Code
- gw
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- Title Language Code
- en
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- Place of Publication
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- Berlin
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- Subject
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- FREE: Silicon crystals -- Defects
- FREE: Silicon crystals -- Spectra
- FREE: Semiconductors -- Defects
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- Data Source
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- CiNii Books
