Kelvin probe force microscopy : from single charge detection to device characterization
Bibliographic Information
- Title
- "Kelvin probe force microscopy : from single charge detection to device characterization"
- Statement of Responsibility
- Sascha Sadewasser, Thilo Glatzel, editors
- Publisher
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- Springer
- Publication Year
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- c2018
- Book size
- 25 cm
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Notes
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130000796801587840
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- NII Book ID
- BB26183199
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- ISBN
- 9783319756868
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- LCCN
- 2018931494
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- Web Site
- https://lccn.loc.gov/2018931494
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- Text Lang
- en
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- Country Code
- sz
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- Title Language Code
- en
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- Place of Publication
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- Cham
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- Classification
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- DC23: 530
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- Subject
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- LCSH: Atomic force microscopy
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- Data Source
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- CiNii Books
- KAKEN