Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A.

Web Site CiNii Available at 6 libraries

Bibliographic Information

Title
"Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A."
Statement of Responsibility
editors, M. Selim Ünlü ... [et al.]
Publisher
  • Materials Research Society
Publication Year
  • 2000
Book size
24 cm

Search this Book/Journal

Notes

Symposium P, "Optical Microstructural Characterization of Semiconductors," at the 1999 MRS Fall Meeting in Boston, Massachusetts

Includes bibliographical references and index

Related Books

See more

Details 詳細情報について

  • CRID
    1130000797230490624
  • NII Book ID
    BA47829560
  • ISBN
    1558994963
  • LCCN
    00028177
  • Web Site
    https://lccn.loc.gov/00028177
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Warrendale, Pa.
  • Data Source
    • CiNii Books
Back to top