Optical fabrication, testing, and metrology : 30 September-3 October 2003, St. Etienne, France

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Bibliographic Information

Title
"Optical fabrication, testing, and metrology : 30 September-3 October 2003, St. Etienne, France"
Statement of Responsibility
Roland Gely, David Rimmer, Lingli Wang, chairs/editors ; Sponsored and published by SPIE--the International Society for Optical Engineering
Publisher
  • SPIE
Publication Year
  • c2004
Book size
28 cm

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Notes

Includes bibliographies and index

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Details 詳細情報について

  • CRID
    1130000797240158336
  • NII Book ID
    BA6859882X
  • ISBN
    0819451363
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Bellingham, Wash., USA
  • Data Source
    • CiNii Books
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