High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts

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書誌事項

タイトル
"High-speed inspection architectures, barcoding, and character recognition : 5-7 November 1990, Boston, Massachusetts"
責任表示
Michael J. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering
出版者
  • SPIE
出版年月
  • c1991
書籍サイズ
28 cm

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注記

"Part of a four-conference program on Machine Vision System Integration held at SPIE's Symposium on Advances in Intelligent Systems, a part of OE/Boston '90, 4-9 November 1990, in Boston, Massachusetts"--P. viii

Includes bibliographical references and index

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