ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands
書誌事項
- タイトル
- "ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands"
- 責任表示
- edited by Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer ; [sponsored by] Electronics Division
- 出版者
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- Electrochemical Society
- 出版年月
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- c1995
- 書籍サイズ
- 23 cm
- タイトル別名
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- Analytical techniques for semiconductor materials and process characterization II
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注記
ALTECH 95 was held Sept. 28-29, 1995 in The Hague, Netherlands in conjunction with ESSDERC 95, the 25th European Solid State Device Research Conference, held Sept. 24-27, 1995
Includes bibliographical references and indexes
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詳細情報 詳細情報について
-
- CRID
- 1130000797585289984
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- NII書誌ID
- BA27796684
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- ISBN
- 1566771226
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- LCCN
- 96061603
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- Web Site
- https://lccn.loc.gov/96061603
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- 本文言語コード
- en
-
- 出版国コード
- us
-
- タイトル言語コード
- en
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- 出版地
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- Pennington, NJ
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- 分類
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- LCC: QD139.S44
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- データソース種別
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- CiNii Books
