Influence of temperature on microelectronics and system reliability

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Bibliographic Information

Title
"Influence of temperature on microelectronics and system reliability"
Statement of Responsibility
Pradeep Lall, Michael G. Pecht, Edward B. Hakim
Publisher
  • CRC Press
Publication Year
  • c1997
Book size
26 cm

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Notes

Includes bibliographical references (p. 257-291) and index

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