Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects

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Bibliographic Information

Title
"Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects"
Statement of Responsibility
edited by H.J. Queisser ... [et al.] ; [sponsored by] the Electrochemical Society. Electronics and Dielectric Science and Technology Divisions
Publisher
  • The Electrochemical Society
Publication Year
  • c1994
Book size
23 cm

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Notes

Includes bibliographies and index

"held October 11-13, 1993 at the Sheraton New Orleans Hotel in New Orleans, LA"

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Details 詳細情報について

  • CRID
    1130000797643492608
  • NII Book ID
    BA23030106
  • ISBN
    1566770378
  • LCCN
    93072866
  • Web Site
    https://lccn.loc.gov/93072866
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Pennington, NJ
  • Data Source
    • CiNii Books
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