Optoelectronic metrology : 28-30 September 1998, Ĺańcut, Poland

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Bibliographic Information

Title
"Optoelectronic metrology : 28-30 September 1998, Ĺańcut, Poland"
Statement of Responsibility
Jan Owsik, Tomasz Więcek,editors ; Wojciech Skrzeczanowski, Ewa Burdziakowska, co-editors ; organized by Institute of Optoelectronics, Military University of Technology, Warsaw(Poland), Central Office of Measures, Warsaw(Poland), Foundation for Industrial and Environmental Science, Rzeszów(Poland)
Publisher
  • SPIE
Publication Year
  • c1998
Book size
28 cm
Series Name / No
  • : pbk

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Details 詳細情報について

  • CRID
    1130000797803583360
  • NII Book ID
    BA60203112
  • ISBN
    0819436445
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Bellingham, Wash., USA
  • Data Source
    • CiNii Books
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