Reliability and materials issues of semiconductor optical and electrical devices and materials : symposium held November 29 - December 3, Boston, Massachusetts, U.S.A.

Materials Research Society. Meeting, Reliability and Materials Issues of Semiconductor Optical and Electrical Devices, Ueda, Osamu

Reliability and materials issues of semiconductor optical and electrical devices and materials : symposium held November 29 - December 3, Boston, Massachusetts, U.S.A.

CiNii 所蔵館 2館

書誌事項

タイトル: "Reliability and materials issues of semiconductor optical and electrical devices and materials : symposium held November 29 - December 3, Boston, Massachusetts, U.S.A."

責任表示: editors, Osamu Ueda ... [et al.]

出版者

Materials Research Society

出版年月

c2010

書籍サイズ: 24 cm

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注記

"Symposium B, 'Reliability and Materials Issues of Semiconductor Optical and Electrical Devices,' was held November 30-December 3 at the 2009 MRS Fall Meeting in Boston, Massachusetts."--Pref

"Fall 2009."--Spine

Includes bibliographical references and indexes

Reliability and materials issues of semiconductor optical and electrical devices and materials : symposium held November 29 - December 3, Boston, Massachusetts, U.S.A.

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Reliability and materials issues of semiconductor optical and electrical devices and materials : symposium held November 29 - December 3, Boston, Massachusetts, U.S.A.

書誌事項

この図書・雑誌をさがす

注記

関連図書・雑誌

詳細情報 詳細情報について

書き出し

詳細情報詳細情報について