Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A.
Bibliographic Information
- Title
- "Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A."
- Statement of Responsibility
- editors, H.R. Huff ... [et al.]
- Publisher
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- Materials Research Society
- Publication Year
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- 1999
- Book size
- 24 cm
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Notes
Includes bibliographical references
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Details 詳細情報について
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- CRID
- 1130000798013434880
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- NII Book ID
- BA43280580
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- ISBN
- 1558994742
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- LCCN
- 99039825
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- Web Site
- https://lccn.loc.gov/99039825
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Warrendale, PA
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- Data Source
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- CiNii Books