Design, Test, Integration, and Packaging of MEMS/MOEMS : 9-11 May 2000, Paris, France
CiNii
Available at 3 libraries
Bibliographic Information
- Title
- "Design, Test, Integration, and Packaging of MEMS/MOEMS : 9-11 May 2000, Paris, France"
- Statement of Responsibility
- Bernard Courtois ... [et al.] ; sponsored by CNRS-INPG-UJF(France), The Institute of Electrical and Electronics Engineers, IEEE Computer Society Test Technology Technical Council
- Publisher
-
- SPIE
- Publication Year
-
- c2000
- Book size
- 28 cm
Search this Book/Journal
- Tweet
Details 詳細情報について
-
- CRID
- 1130000798020468096
-
- NII Book ID
- BA60204603
-
- ISBN
- 0819436453
-
- Text Lang
- en
-
- Country Code
- us
-
- Title Language Code
- en
-
- Place of Publication
-
- Bellingham, Wash.
-
- Data Source
-
- CiNii Books