Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA

Web Site CiNii Available at 1 libraries

Bibliographic Information

Title
"Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA"
Statement of Responsibility
Kevin G. Harding, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering
Publisher
  • SPIE
Publication Year
  • c2005
Book size
28 cm
Series Name / No
  • pbk.

Search this Book/Journal

Notes

Previous conference entitled: Two- and three-dimensional vision systems for inspection, control, and metrology

Includes bibliographical references and author index

Related Books

See more

Details 詳細情報について

Back to top