Stereology and morphometry in electron microscopy : problems and solutions
Bibliographic Information
- Title
- "Stereology and morphometry in electron microscopy : problems and solutions"
- Statement of Responsibility
- edited by Albrecht Reith, Terry M. Mayhew ; with a foreword by Ewald R. Weibel
- Publisher
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- Hemisphere Pub. Corp.
- Publication Year
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- c1988
- Book size
- 24 cm
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Notes
Bibliography: p. 211-212
Includes index
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Details 詳細情報について
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- CRID
- 1130000798183071616
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- NII Book ID
- BA20314424
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- ISBN
- 0891166238
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- LCCN
- 87035365
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- Web Site
- https://lccn.loc.gov/87035365
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- New York
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- Subject
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- LCSH: Electron microscopy -- Technique
- LCSH: Stereology
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- Data Source
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- CiNii Books