Optical and dimensional-measurement problems with photomasking in microelectronics
Bibliographic Information
- Title
- "Optical and dimensional-measurement problems with photomasking in microelectronics"
- Statement of Responsibility
- John M. Jerke
- Publisher
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- U.S. G.P.O.
- Publication Year
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- 1975
- Book size
- 26 cm
- Volume(Year)
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- 400-20
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Notes
Bibliography: p. 31-36
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Details 詳細情報について
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- CRID
- 1130000798273299328
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- NII Book ID
- BA73257191
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- LCCN
- 75619190
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Washington
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- Classification
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- LCC: QC100
- LCC: TK7874
- DC: 389/.08 s
- DC: 621.381/73
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- Subject
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- LCSH: Integrated circuits -- Masks
- LCSH: Photolithography
- LCSH: Optical measurements
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- Data Source
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- CiNii Books