Testing, reliability, and applications of optoelectronic devices : 24-26 January, 2001, San Jose, [California] USA
Bibliographic Information
- Title
- "Testing, reliability, and applications of optoelectronic devices : 24-26 January, 2001, San Jose, [California] USA"
- Statement of Responsibility
- Aland K. Chin ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
- Publisher
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- SPIE
- Publication Year
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- c2001
- Book size
- 28 cm
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Notes
Includes bibliographic references and author index
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Details 詳細情報について
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- CRID
- 1130006728301644295
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- NII Book ID
- BC07476197
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- ISBN
- 0819439630
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- LCCN
- 2001277958
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- Web Site
- https://lccn.loc.gov/2001277958
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Washington
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- Classification
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- LCC: TK8300
- DC21: 621.3815/2
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- Data Source
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- CiNii Books