Testing, reliability, and applications of optoelectronic devices : 24-26 January, 2001, San Jose, [California] USA

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Bibliographic Information

Title
"Testing, reliability, and applications of optoelectronic devices : 24-26 January, 2001, San Jose, [California] USA"
Statement of Responsibility
Aland K. Chin ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
Publisher
  • SPIE
Publication Year
  • c2001
Book size
28 cm

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Notes

Includes bibliographic references and author index

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