Testing, reliability, and application of micro- and nano-material systems IV : 28 February-2 March 2006, San Diego, California, USA

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書誌事項

タイトル
"Testing, reliability, and application of micro- and nano-material systems IV : 28 February-2 March 2006, San Diego, California, USA"
責任表示
Robert E. Geer ... [et al.], chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by ASME--American Society of Mechanical Engineers (USA) ; cooperating organizations, Intelligent Materials Forum (Japan), Jet Propulsion Laboratory (USA), National Science Foundation (USA)
出版者
  • SPIE
出版年月
  • c2006
書籍サイズ
28 cm
シリーズ名/番号
  • pbk.
タイトル別名
  • Testing, reliability, and application of micro- and nano-material systems 4

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Includes bibliographical references and author index

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