Atomic force microscopy for energy research

CiNii 所蔵館 1館

書誌事項

タイトル
"Atomic force microscopy for energy research"
責任表示
edited by Cai Shen
出版者
  • CRC Press
出版年月
  • 2022
書籍サイズ
25 cm
シリーズ名/番号
  • : hbk

この図書・雑誌をさがす

注記

Includes bibliographical references and index

Summary: "Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials such as lithium batteries, electrochemical catalysis, solar cells, and other energy-related materials are addressed. With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics working with AFM or planning to use it in their own fields of research, especially energy research"-- Provided by publisher

関連図書・雑誌

もっと見る

詳細情報 詳細情報について

ページトップへ