Atomic force microscopy for energy research
書誌事項
- タイトル
- "Atomic force microscopy for energy research"
- 責任表示
- edited by Cai Shen
- 出版者
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- CRC Press
- 出版年月
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- 2022
- 書籍サイズ
- 25 cm
- シリーズ名/番号
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- : hbk
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注記
Includes bibliographical references and index
Summary: "Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials such as lithium batteries, electrochemical catalysis, solar cells, and other energy-related materials are addressed. With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics working with AFM or planning to use it in their own fields of research, especially energy research"-- Provided by publisher
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詳細情報 詳細情報について
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- CRID
- 1130011528813134208
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- NII書誌ID
- BC16067687
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- ISBN
- 9781032004075
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- 本文言語コード
- en
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- 出版国コード
- us
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- タイトル言語コード
- en
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- 出版地
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- Boca Raton, FL
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- 件名
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- LCSH: Atomic force microscopy
- LCSH: Power resources -- Research
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- データソース種別
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- CiNii Books