Defect recognition and image processing in III-V compounds III : proceedings of the Third International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Tokyo, Japan, 22-25 September 1989

Details 詳細情報について

• CRID

  1130282268675248000

• NII Book ID

  BA10947898

• Text Lang

  en

• Country Code

  ne

• Title Language Code

  en

• Place of Publication

  • Amsterdam

• Classification

  • LCC: TK7871.85
  • DC19: 621.3815/2

• Subject

  • LCSH: Semiconductors -- Defects -- Congresses
  • LCSH: Gallium arsenide -- Congresses
  • LCSH: Image processing -- Congresses

• Data Source

  • CiNii Books