Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida
Bibliographic Information
- Title
- "Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida"
- Statement of Responsibility
- Edward M. Granger, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Center for Applied Optics/University of Alabama in Huntsville ... [et al.]
- Publisher
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- SPIE
- Publication Year
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- c1987
- Book size
- 28 cm
- Series Name / No
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- : pbk
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Notes
Includes bibliographies and index
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Details 詳細情報について
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- CRID
- 1130282268821218048
-
- NII Book ID
- BA0711948X
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- ISBN
- 0892528117
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- LCCN
- 87061625
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- Web Site
- https://lccn.loc.gov/87061625
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- Bellingham, Wash., USA
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- Classification
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- LCC: TA1750
- DC20: 621.381/045
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- Data Source
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- CiNii Books