Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida

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Bibliographic Information

Title
"Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida"
Statement of Responsibility
Edward M. Granger, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Center for Applied Optics/University of Alabama in Huntsville ... [et al.]
Publisher
  • SPIE
Publication Year
  • c1987
Book size
28 cm
Series Name / No
  • : pbk

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Notes

Includes bibliographies and index

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