Semiconductor measurement technology : spreading resistance symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974

書誌事項

タイトル
"Semiconductor measurement technology : spreading resistance symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974"
責任表示
James R. Ehrstein, editor
出版者
  • U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
出版年月
  • 1974
書籍サイズ
27 cm
巻次・年月次
  • 400-10
タイトル別名
  • Spreading resistance symposium

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注記

"Under the sponsorship of Committee F-1 of the American Society for Testing and Materials and the National Bureau of Standards."

Bibliography: p. 279-281

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