Defect recognition and image processing in semiconductors 1997 : proceedings of the Seventh International Conference on Defect Recognition and Image Porcessing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September, 1997

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Bibliographic Information

Title
"Defect recognition and image processing in semiconductors 1997 : proceedings of the Seventh International Conference on Defect Recognition and Image Porcessing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September, 1997"
Statement of Responsibility
edited by J. Donecker and I. Rechenberg
Publisher
  • Institute of Physics
Publication Year
  • c1998
Book size
24 cm

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Notes

Includes bibliographical references and index

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