SAE residual stress measurement by x-ray diffraction

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Bibliographic Information

Title
"SAE residual stress measurement by x-ray diffraction"
Publisher
  • SAE International
  • 2003 ed
Publication Year
  • c2003
Book size
28 cm
Other Title
  • Residual stress measurement by x-ray diffraction

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Notes

Includes bibliographical references

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Details 詳細情報について

  • CRID
    1130282269592228864
  • NII Book ID
    BA67224518
  • ISBN
    9780768010695
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Warrendale, Pa.
  • Data Source
    • CiNii Books
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