CMOS gate-stack scaling--materials, interfaces and reliability implications : symposium held April 14-16, 2009, San Francisco, California, U.S.A.

Demkov, Alexander A., Taylor, Bill, Harris, H. Rusty, Butterbaugh, Jeffery W., Rachmady, Willy, Materials Research Society. Spring Meeting

CMOS gate-stack scaling--materials, interfaces and reliability implications : symposium held April 14-16, 2009, San Francisco, California, U.S.A.

CiNii 所蔵館 3館

書誌事項

タイトル: "CMOS gate-stack scaling--materials, interfaces and reliability implications : symposium held April 14-16, 2009, San Francisco, California, U.S.A."

責任表示: editors: Alexander A. Demkov ... [et al.]

出版者

Materials Research Society

出版年月

c2009

書籍サイズ: 24 cm

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注記

Other editors: Bill Taylor, H. Rusty Harris, Jeffery W. Butterbaugh, Willy Rachmady

Includes bibliographical references and indexes

"..., 'CMOS gate-stack scaling--materials, interfaces and reliability implications,' held April 14-16 at the 2009 MRS Spring Meeting in San Francisco, California."--Pref.

CMOS gate-stack scaling--materials, interfaces and reliability implications : symposium held April 14-16, 2009, San Francisco, California, U.S.A.

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CMOS gate-stack scaling--materials, interfaces and reliability implications : symposium held April 14-16, 2009, San Francisco, California, U.S.A.

書誌事項

この図書・雑誌をさがす

注記

関連図書・雑誌

詳細情報 詳細情報について

書き出し

詳細情報詳細情報について