IDDQ testing of VLSI circuits

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Bibliographic Information

Title
"IDDQ testing of VLSI circuits"
Statement of Responsibility
edited by Ravi K. Gulati and Charles F. Hawkins
Publisher
  • Kluwer Academic Publishers
Publication Year
  • c1993
Book size
27 cm

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Notes

"A Special issue of Journal of electronic testing: theory and applications."

"Reprinted from Journal of electronic testing: theory and applications, vol. 3, no. 4."

DDQ is subscript in IDDQ in title; testing method also known as quiescent current testing

Includes bibliographical references and index

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