Nondestructive evaluation of semiconductor materials and devices
Bibliographic Information
- Title
- "Nondestructive evaluation of semiconductor materials and devices"
- Statement of Responsibility
- edited by Jay N. Zemel
- Publisher
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- Plenum Press
- Publication Year
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- c1979
- Book size
- 26 cm
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Notes
Lectures presented at the NATO Advanced Study Institute on Nondestructive Evaluationof Semiconductor Materials and Devices, held at the Villa Tuscolano, Italy,September 19-29, 1978
Includes bibliographical references and index
"Published in cooperation with NATO Scientific Affairs Division."
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Details 詳細情報について
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- CRID
- 1130282269973096192
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- NII Book ID
- BA13158566
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- ISBN
- 0306402939
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- LCCN
- 79016499
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- Web Site
- https://lccn.loc.gov/79016499
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- Text Lang
- en
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- Country Code
- us
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- Title Language Code
- en
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- Place of Publication
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- New York
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- Classification
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- LCC: TK7871.85
- DC: 621.3815/2/028
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- Subject
-
- Data Source
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- CiNii Books