Symposium on X-ray and electron probe analysis : presented at the Sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963

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Bibliographic Information

Title
"Symposium on X-ray and electron probe analysis : presented at the Sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N. J., June 27, 1963"
Publisher
  • ASTM
Publication Year
  • 1964
Book size
24 cm

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Details 詳細情報について

  • CRID
    1130282270078581120
  • NII Book ID
    BA01667686
  • LCCN
    64021661
  • Web Site
    https://lccn.loc.gov/64021661
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Philadelphia
  • Data Source
    • CiNii Books
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