Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963

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Bibliographic Information

Title
"Techniques of electron microscopy, diffraction, and microprobe analysis : presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 26, 1963"
Publisher
  • ASTM
Publication Year
  • c1964
Book size
23 cm

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Notes

"Sponsored by Subcommittee XI on Electron Microstructure of Metals of ASTM Committee E-4 on Metallography."

This is v.5 of "ASTM advances in electron metallography series" (data based on Advances in electron metallography, v.6, 1966)

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Details 詳細情報について

  • CRID
    1130282270174839296
  • NII Book ID
    BA04549493
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Philadelphia
  • Data Source
    • CiNii Books
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