Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II
書誌事項
- タイトル
- "Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II"
- 責任表示
- editors, Bernd O. Kolbesen ... [et al.] ; Electronics Division [of the Electrochemical Society]
- 出版者
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- Electrochemical Society
- 出版年月
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- c1997
- 書籍サイズ
- 23 cm
- タイトル別名
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- Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II
この図書・雑誌をさがす
注記
"This ... volume contains the 13 invited papers, 21 of 22 contributed papers and 10 papers presented as poster at the Second Symposium on 'Crystalline Defects and Contamination: their Impact and Control in Device Manufacturing' which was part 01B of the Symposium on Silicon Cleaning Technology' held at the '1997 Joint International Meeting--The 192nd Meeting of the Electrochemical Society and the 48th Annual Meeting of the International Society of Electrochemistry' from August 31 to September 5, 1997 in Paris/France."--Preface
Includes bibliographic references and indexes
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詳細情報 詳細情報について
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- CRID
- 1130282270321709312
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- NII書誌ID
- BA43133972
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- ISBN
- 1566771757
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- LCCN
- 97197231
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- Web Site
- https://lccn.loc.gov/97197231
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- 本文言語コード
- en
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- 出版国コード
- us
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- タイトル言語コード
- en
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- 出版地
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- Pennington, NJ
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- データソース種別
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- CiNii Books