Bibliographic Information
- Title
- "Defect analysis in electron microscopy"
- Statement of Responsibility
- M.H. Loretto and R.E. Smallman
- Publisher
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- Chapman and Hall
- Publication Year
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- 1975
- Book size
- 24 cm
- Series Name / No
-
- cased edition
- Science Paperback edition
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Notes
"A Halsted Press book."
Bibliography: p. 131
Includes index
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Details 詳細情報について
-
- CRID
- 1130282270343250944
-
- NII Book ID
- BA1401594X
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- ISBN
- 047054760X
- 0412137607
- 0412137704
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- LCCN
- 75025615
-
- Web Site
- https://lccn.loc.gov/75025615
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- Text Lang
- en
-
- Country Code
- uk
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- Title Language Code
- en
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- Place of Publication
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- London
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- Subject
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- LCSH: Crystals -- Defects
- LCSH: Electron microscopy
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- Data Source
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- CiNii Books