Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan

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Bibliographic Information

Title
"Matching Japan in quality : how the leading U.S. semiconductor firms caught up with the best in Japan"
Statement of Responsibility
William F. Finan
Publisher
  • Center for International Studies, Massachusetts Institute of Technology
Publication Year
  • [1993?]
Book size
28 cm

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Notes

Includes bibliographical references

"Distributed courtesy of the MIT Japan program, science, technology, management"

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Details 詳細情報について

  • CRID
    1130282270520598400
  • NII Book ID
    BA37393232
  • Text Lang
    en
  • Country Code
    us
  • Title Language Code
    en
  • Place of Publication
    • Cambridge, Mass.
  • Data Source
    • CiNii Books
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