ARPA/NBS workshop I. measurement problems in integrated circuit processing and assembly

Name: ARPA/NBS workshop I. measurement problems in integrated circuit processing and assembly
Author: Schafft, Harry A.

HathiTrust 1974 Web Site CiNii Available at 2 libraries

Bibliographic Information

Title: "ARPA/NBS workshop I. measurement problems in integrated circuit processing and assembly"

Publisher

Publication Year

Volume(Year)

CRID

1130282270788146176
NII Book ID

BA73253907
LCCN

74600001
Web Site

https://lccn.loc.gov/74600001

https://catalog.hathitrust.org/Record/011400091
Text Lang

en
Country Code

us
Title Language Code

en
Place of Publication
- Washington
Classification
- LCC: QC100
- LCC: TK7874
- DC: 389/.08 s
- DC: 621.381/73
Subject
- LCSH: Integrated circuits -- Congresses
- LCSH: Semiconductors -- Congresses
- LCSH: Electronic measurements -- Congresses
Data Source
- CiNii Books

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