書誌事項
- タイトル
- "Yield simulation for integrated circuits"
- 責任表示
- by Duncan Moore Henry Walker
- 出版者
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- Kluwer Academic Publishers
- 出版年月
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- c1987
- 書籍サイズ
- 25 cm
この図書・雑誌をさがす
注記
Based on author's thesis (Ph. D.)
Includes bibliographical references and index
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詳細情報 詳細情報について
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- CRID
- 1130282270891915904
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- NII書誌ID
- BA07139931
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- ISBN
- 0898382440
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- LCCN
- 87017302
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- Web Site
- https://lccn.loc.gov/87017302
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- 本文言語コード
- en
-
- 出版国コード
- us
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- タイトル言語コード
- en
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- 出版地
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- Boston
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- 分類
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- LCC: TK7874
- DC19: 621.381/73
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- 件名
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- LCSH: Integrated circuits -- Very large scale integration -- Design and construction -- Mathematical models
- LCSH: Integrated circuits -- Very large scale integration -- Design and construction -- Data processing
- LCSH: Integrated circuits -- Very large scale integration -- Defects -- Mathematical models
- LCSH: Integrated circuits -- Very large scale integration -- Defects -- Data processing
- LCSH: Monte Carlo method
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- データソース種別
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- CiNii Books
