Progress in measurement and testing : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China
CiNii
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Bibliographic Information
- Title
- "Progress in measurement and testing : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China"
- Statement of Responsibility
- edited by Yanwen Wu
- Publisher
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- Trans Tech Publications
- Publication Year
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- c2010
- Book size
- 25 cm
- Series Name / No
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- :[set]
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Notes
Includes bibliographical references and index
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Details 詳細情報について
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- CRID
- 1130282271062647680
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- NII Book ID
- BB02714530
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- ISBN
- 9780878492695
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- Text Lang
- en
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- Country Code
- sz
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- Title Language Code
- en
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- Place of Publication
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- Stafa-Zurich
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- Classification
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- DC22: 620.112
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- Subject
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- LCSH: Materials -- Testing -- Congresses
- LCSH: Materials science -- Congresses
- LCSH: Industrial design -- Congresses
- FREE: Advanced measurements
- FREE: Advanced tests
- FREE: AMT
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- Data Source
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- CiNii Books